Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

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Bibliographic Details
Main Authors:	Koren, Elad, Allen, Jonathan E., Givan, Uri, Berkovitch, Noel, Hemesath, Eric R., Lauhon, Lincoln J., Rosenwaks, Yossi
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/16377
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