A Quantum Q-Learning Fault Diagnosis Method for Intelligent Manufacturing Equipment
In the era of rapid industrial automation advancements, the complexity of intelligent manufacturing equipment has been steadily escalated. Stringent demands for high-efficiency and high-precision diagnosis are increasingly being unmet by conventional fault diagnosis methods. To address these challen...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-07-01
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| Series: | Machines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2075-1702/13/7/629 |
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