Neural network technology for identifying defect sizes in half-plane based on time and positional scanning

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Neural network technology for identifying defect sizes in half-plane based on time and positional scanning

Introduction. The selected research topic urgency is due to the need for a quick assessment of the condition and reliability of materials used in various designs. The work objective was to study parameters of the influence of the defect on the response of the surface of the medium to the shock effec...

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Библиографические подробности
Главные авторы:	A. N. Solov'ev, A. V. Cherpakov, P. V. Vasil’ev, I. A. Parinov, E. V. Kirillova
Формат:	Статья
Язык:	русский
Опубликовано:	Don State Technical University 2020-10-01
Серии:	Advanced Engineering Research
Предметы:	flat layered structure defect non-destructive diagnostics fe modeling impulse action unsteady oscillations surface waves artificial neural networks positional scanning amplitude-time characteristics
Online-ссылка:	https://www.vestnik-donstu.ru/jour/article/view/1685
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

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