Neural network technology for identifying defect sizes in half-plane based on time and positional scanning
Introduction. The selected research topic urgency is due to the need for a quick assessment of the condition and reliability of materials used in various designs. The work objective was to study parameters of the influence of the defect on the response of the surface of the medium to the shock effec...
में बचाया:
| मुख्य लेखकों: | , , , , |
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| स्वरूप: | लेख |
| भाषा: | रूसी |
| प्रकाशित: |
Don State Technical University
2020-10-01
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| श्रृंखला: | Advanced Engineering Research |
| विषय: | |
| ऑनलाइन पहुंच: | https://www.vestnik-donstu.ru/jour/article/view/1685 |
| टैग: |
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