Identification of electrical breakdown faults in shunt capacitor bank elements using instantaneous negative sequence current
Electrical breakdown faults (EBFs) in shunt capacitor banks (SCB) elements always occur near the transient overvoltage peak induced by the energization of SCBs. Accurate and timely detection of EBFs is vital to effectively monitor the condition of SCBs. Due to the subtle changes in capacitance, the...
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| Hoofdauteurs: | , , , , |
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| Formaat: | Artikel |
| Taal: | Engels |
| Gepubliceerd in: |
Elsevier
2025-09-01
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| Reeks: | International Journal of Electrical Power & Energy Systems |
| Onderwerpen: | |
| Online toegang: | http://www.sciencedirect.com/science/article/pii/S0142061525005101 |
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