Identification of electrical breakdown faults in shunt capacitor bank elements using instantaneous negative sequence current
Electrical breakdown faults (EBFs) in shunt capacitor banks (SCB) elements always occur near the transient overvoltage peak induced by the energization of SCBs. Accurate and timely detection of EBFs is vital to effectively monitor the condition of SCBs. Due to the subtle changes in capacitance, the...
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| Главные авторы: | , , , , |
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| Формат: | Статья |
| Язык: | английский |
| Опубликовано: |
Elsevier
2025-09-01
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| Серии: | International Journal of Electrical Power & Energy Systems |
| Предметы: | |
| Online-ссылка: | http://www.sciencedirect.com/science/article/pii/S0142061525005101 |
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