Hyper-resolution in X-ray emission spectroscopy: integrating extended-range high energy resolution fluorescence detection and multiple-crystal spectrometry with advanced binary data splicing

Hyper-resolution in X-ray emission spectroscopy: integrating extended-range high energy resolution fluorescence detection and multiple-crystal spectrometry with advanced binary data splicing

This study of manganese (Mn, Z = 25) introduces a novel combination of extended-range high energy resolution fluorescence detection (XR-HERFD), multiple-crystal spectrometers and advanced binary data splicing techniques to address challenges in X-ray emission spectroscopy. XR-HERFD enhances spectral...

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Bibliographic Details
Main Authors: Ramesh Rijal, Jack Stephens, Daniel Sier, Nicholas T. T. Tran, Truong V. B. Nguyen, Jonathan W. Dean, Pierce Bowman, Minh Dao, Paul Di Pasquale, Tony Kirk, Chanh Q. Tran, Shusaku Hayama, Matteo Aramini, Nitya Ramanan, Sofia Diaz-Moreno, Christopher T. Chantler
Format: Article
Language:English
Published: International Union of Crystallography 2025-07-01
Series:Journal of Synchrotron Radiation
Subjects:
xr-herfd
extended-range high energy resolution fluorescence detection
multiple-crystal spectrometers
advanced binary data splicing
manganese
Online Access:https://journals.iucr.org/paper?S1600577525004084
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https://journals.iucr.org/paper?S1600577525004084

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