Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes

Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes

It is undeniable that novel 2D devices and heterostructures will have a lasting impact on the advancement of future technologies. However, the inherent instability of many exfoliated van der Waals (vdW) materials is a well-known hurdle yet to be overcome. Thus, the sustained interest in exfoliated v...

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Main Authors: M. F. DiScala, V. Hsieh, B. S. Jessen, Y. Gu, D. J. Rizzo, J. M. Amontree, X. Yan, Q. Wang, M. Kapfer, T. Kim, M. Geiwitz, G. Natale, J. Pelliciari, J. C. Hone, K. S. Burch, D. N. Basov, C. R. Dean, V. Bisogni, K. W. Plumb
Format: Article
Language:English
Published: Frontiers Media S.A. 2025-06-01
Series:Frontiers in Electronic Materials
Subjects:
resonant inelastic soft X-ray scattering (RIXS)
2D magnetism
magnetism
prospects
van der Waals (vdW)
NiPS3
Online Access:https://www.frontiersin.org/articles/10.3389/femat.2025.1572940/full
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https://www.frontiersin.org/articles/10.3389/femat.2025.1572940/full

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