In situ high-resolution cryo-EM reconstructions from CEMOVIS
Cryo-electron microscopy can be used to image cells and tissue at high resolution. To ensure electron transparency, the sample thickness must not exceed 500 nm. Focused-ion-beam (FIB) milling has become the standard method for preparing thin samples (lamellae); however, the material removed by the m...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
International Union of Crystallography
2025-07-01
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| Series: | IUCrJ |
| Subjects: | |
| Online Access: | https://journals.iucr.org/paper?S2052252525005196 |
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