Investigations on the aging of ZnON thin film transistors and the effect of annealing on device performance
This study investigates the aging effects of zinc oxynitride (ZnON) thin-film transistors (TFTs) and the effect of annealing under different environments on the device performance. The temporal degradation of these TFTs is attributed to nitrogen desorption and adsorption of ambient species. Analytic...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2025-01-01
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| Series: | Materials Research Express |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2053-1591/adeb48 |
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