One-Time Programmable Memory for Ultra-Low Power ANN Inference Accelerator With Security Against Thermal Fault Injection
Memory technologies for in-memory computing (IMC) based neural network (NN) operations in edge devices face two primary challenges. First, these technologies often exhibit an excessive average power due to the high currents in the memory’s low and high resistance state (LRS and HRS). Seco...
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Main Authors: | , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
IEEE
2025-01-01
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Series: | IEEE Journal of the Electron Devices Society |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10771781/ |
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