One-Time Programmable Memory for Ultra-Low Power ANN Inference Accelerator With Security Against Thermal Fault Injection

Memory technologies for in-memory computing (IMC) based neural network (NN) operations in edge devices face two primary challenges. First, these technologies often exhibit an excessive average power due to the high currents in the memory’s low and high resistance state (LRS and HRS). Seco...

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Bibliographic Details
Main Authors: Shreyas Deshmukh, Ankit Bende, Diti Sanghai, Vivek Saraswat, Anmol Biswas, Abhishek Kadam, Shubham Patil, Ajay Kumar Singh, Veeresh Deshpande, Udayan Ganguly
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10771781/
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