Ar+ implantation-induced tailoring of RF-sputtered ZnO films: structural, morphological, and optical properties

Radio frequency-sputtered zinc oxide films are implanted with 30 keV Ar+ ions at various fluences ranging from 1 × 1015 to 2 × 1016 ions·cm−2. Raman spectra reveal the presence of the E2 (low), E2 (high), and A1 (LO) Raman modes in pristine and implanted ZnO films. A gradual fall and rise in peak in...

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Bibliographic Details
Main Authors: Manu Bura, Divya Gupta, Arun Kumar, Sanjeev Aggarwal
Format: Article
Language:English
Published: Beilstein-Institut 2025-06-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.16.66
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