Nanofabrication of sharp conductive diamond tip probe chips and their application in reverse tip sample scanning probe microscopy

Recently, a new scanning probe microscopy (SPM) concept called reverse tip sample scanning probe microscopy (RTS SPM) was introduced. Here, a sample is mounted at the end of a cantilever beam and scans over a tip that is integrated into an array of hundreds of SPM tips, overcoming one of the major l...

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Bibliographic Details
Main Authors: L. Wouters, J. Cho, S. Gim, J. Yang, A. Kanniainen, K. Lee, P. Lagrain, N. Peric, T. Hantschel
Format: Article
Language:English
Published: Elsevier 2025-09-01
Series:Micro and Nano Engineering
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590007225000139
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