Influence of Side-Polished Fiber Surface Topography on Surface Plasmon Resonance Wavelengths and the Full Width at Half-Maximum

The influence of surface topography of side-polished fiber on resonance wavelengths and the full-width-at-half-maximum (FWHM) of surface plasmon resonance was evaluated in this work, based on the power spectrum density, wavelet, and finite-difference time-domain methods. The abrasive size determined...

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Bibliographic Details
Main Authors: Zhiyong Bai, Mingquan Li, Jing Zhao, Shaoqing Cao, Ying Wang, Changrui Liao, Yiping Wang
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Photonics Journal
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Online Access:https://ieeexplore.ieee.org/document/7862833/
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