Measuring Optical Scattering in Relation to Coatings on Crystalline X-Ray Scintillator Screens
Scattered light makes up a significant amount of recorded intensities during tomographic imaging, thereby leading to severe misinterpretation and artifacts in the reconstructed volume images. Correcting artificial intensities that stem from scattered light, therefore, is of primary interest and dema...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-06-01
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| Series: | Crystals |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-4352/15/7/605 |
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