Crystallographic benchmarking of powder X-ray line diffraction pattern profiling of monoclinic sucrose nanocrystal
The structural and geometrical properties of sucrose were examined using powder X-ray diffraction (XRD). XRD analysis provided insights into the atomic orientation and enabled precise refinement of lattice parameters and crystal symmetry. Rietveld refinement confirmed a 100 % crystalline sucrose pha...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-08-01
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| Series: | Results in Surfaces and Interfaces |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2666845925001825 |
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