Crystallographic benchmarking of powder X-ray line diffraction pattern profiling of monoclinic sucrose nanocrystal

Crystallographic benchmarking of powder X-ray line diffraction pattern profiling of monoclinic sucrose nanocrystal

The structural and geometrical properties of sucrose were examined using powder X-ray diffraction (XRD). XRD analysis provided insights into the atomic orientation and enabled precise refinement of lattice parameters and crystal symmetry. Rietveld refinement confirmed a 100 % crystalline sucrose pha...

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Bibliographic Details
Main Authors: Md. Khalid Hossain Shishir, Md. Mynul Islam, Md. Tarikul Islam, Md. Ashikur Rahaman, Md. Hasnain Mustak, Md. Golam Mostafa, Md. Ashraful Alam
Format: Article
Language:English
Published: Elsevier 2025-08-01
Series:Results in Surfaces and Interfaces
Subjects:
Crystallography
Crystal structure
Crystal growth
Sucrose
Morphology
Online Access:http://www.sciencedirect.com/science/article/pii/S2666845925001825
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http://www.sciencedirect.com/science/article/pii/S2666845925001825

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