The Impact of Gas Cluster Ion Beam Sputtering on the Chemical and Electronic Structure of Methyl Ammonium Lead Iodide Thin Films
Abstract The stability and performance of metal halide perovskite (MHP) optoelectronic devices are significantly influenced by the chemical and electronic properties of their interfaces, often studied using photoelectron spectroscopy (PES). MHP films, containing organic cations, are susceptible to s...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2025-06-01
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| Series: | Advanced Materials Interfaces |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/admi.202500102 |
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