Defect Detection and Correction in OpenMP: A Static Analysis and Machine Learning-Based Solution

Defect Detection and Correction in OpenMP: A Static Analysis and Machine Learning-Based Solution

Concurrency defects such as race conditions, deadlocks, and improper synchronization remain a critical challenge in developing reliable OpenMP-based parallel applications. Traditional static analysis tools often focus only on defect detection, offering limited or no automated correction capabilities...

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Bibliographic Details
Main Authors: Norah A. Al-Johany, Fathy E. Eassa, Sanaa A. Sharaf, Eynas H. Balkhair, Sara M. Assiri
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Static analysis
OpenMP
parallel programming
data races
deadlocks
software defect detection
Online Access:https://ieeexplore.ieee.org/document/11082155/
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https://ieeexplore.ieee.org/document/11082155/

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