Schultz, T., Jha, R., Dupaix, B., & Casto, M. (2025). ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs. IEEE.
Chicago Style (17th ed.) CitationSchultz, Thomas, Rashmi Jha, Brian Dupaix, and Matt Casto. ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs. IEEE, 2025.
MLA (9th ed.) CitationSchultz, Thomas, et al. ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs. IEEE, 2025.
Warning: These citations may not always be 100% accurate.