ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs
This paper reports an approach for monitoring aging and integrity of CMOS circuits through additively manufactured Resistive Random-Access Memory (ReRAM) based test structures. MgO-based ReRAM devices demonstrated excellent temperature sensing and aging modalities with simultaneous storage of sensed...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8891739/ |
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