Finite Element Modelling of Atomic Force Microscope Cantilever Beams with Uncertainty in Material and Dimensional Parameters

The stiffness and the natural frequencies of a rectangular and a V-shaped micro-cantilever beams used in Atomic Force Microscope (AFM) were analysed using the Finite Element (FE) method. A determinate analysis in the material and dimensional parameters was first carried out to compare with published...

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Bibliografiset tiedot
Päätekijät: Bin WANG, Xiao WU, Tat-Hean GAN, Alexis RUSINEK
Aineistotyyppi: Artikkeli
Kieli:englanti
Julkaistu: Institute of Fundamental Technological Research 2014-12-01
Sarja:Engineering Transactions
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Linkit:https://et.ippt.pan.pl/index.php/et/article/view/265
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