PVT Analysis and Behavioral Modeling of Doherty and Envelope Tracking RF ULP Power Amplifiers using 65 nm CMOS Technology
This research encompasses both Process-Voltage-Temperature (PVT) considerations and behavioral modeling of two proposed Power Amplifier (PA) designs for wireless communication systems. Process variations, supply voltage changes, and temperature changes provide difficulties for the design and optimi...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sir Syed University of Engineering and Technology, Karachi.
2023-12-01
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| Series: | Sir Syed University Research Journal of Engineering and Technology |
| Online Access: | http://www.sirsyeduniversity.edu.pk/ssurj/rj/index.php/ssurj/article/view/589 |
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