Identification of Plasmonic Absorption Profile in Surface Plasmon Microscopy Using Morphology
Surface plasmon microscopy (SPM) provides the capability of measuring surface properties of subnanometer layers within the diffraction limited order. In a typical SPM, small changes correspond to surface plasmons (SPs) absorption profile variations on a reflecting back focal plane (BFP), which can b...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8486642/ |
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