Characterization of the Information Leakage of Cryptographic Devices by Using EM Anal

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Bibliographic Details
Main Authors:	Meynard, Olivier, Guilley, Sylvain, Danger, Jean-Luc, Hayashi, Yu-Ichi, Homma, Naofumi
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2012
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/37399
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