Spectroscopic Ellipsometry of Ion-Implantation-Induced Damage
None
Saved in:
| Main Authors: | Shamiryan, Denis, Likhachev, Dmitriy V. |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/37187 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Infrared Spectroscopic Ellipsometry for Ion-Implanted Silicon Wafers
by: Li, et al.
Published: (2011) -
Nonlinear Ellipsometry by Second Harmonic Generation
by: Bovino, Fabio Antonio, et al.
Published: (2012) -
New Generation Biosensors based on Ellipsometry
by: Garipcan, Bora, et al.
Published: (2011) -
Ion Implantation-Induced Layer Splitting of Semiconductors
by: Dadwal, U., et al.
Published: (2012) -
High Mass Molecular Ion Implantation
by: Chang, Bill, et al.
Published: (2011)


