High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait
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| Main Authors: | , |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/33204 |
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