High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait

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Bibliographic Details
Main Authors:	Chu, Jen-You, Wang, Juen-Kai
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2012
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/33204
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