High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait
None
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/33204 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1839564586340057088 |
|---|---|
| author | Chu, Jen-You Wang, Juen-Kai |
| author_facet | Chu, Jen-You Wang, Juen-Kai |
| author_sort | Chu, Jen-You |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/27458 |
| first_indexed | 2025-08-04T22:11:39Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-33204</identifier><datestamp>2012-03-21</datestamp>
<dc:title>High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait</dc:title>
<dc:creator>Jen-You Chu</dc:creator>
<dc:creator>Juen-Kai Wang</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2012-03-21</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/33204</dc:identifier>
<dc:identifier>doi:10.5772/27458</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-51-0153-6</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/875 ; Advanced Photonic Sciences</dc:source>
</oai_dc:dc> |
| id | InTech-33204 |
| institution | Matheson Library |
| isbn | 978-953-51-0153-6 |
| language | English |
| last_indexed | 2025-08-04T22:11:39Z |
| publishDate | 2012 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-332042012-03-21 High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait Jen-You Chu Juen-Kai Wang Physical Sciences, Engineering and Technology None IntechOpen 2012-03-21 Chapter, Part Of Book https://www.intechopen.com/chapters/33204 doi:10.5772/27458 en ISBN:978-953-51-0153-6 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/875 ; Advanced Photonic Sciences |
| spellingShingle | Physical Sciences, Engineering and Technology Chu, Jen-You Wang, Juen-Kai High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait |
| title | High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait |
| title_full | High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait |
| title_fullStr | High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait |
| title_full_unstemmed | High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait |
| title_short | High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait |
| title_sort | high resolution near field optical microscopy a sub 10 nanometer probe for surface electromagnetic field and local dielectric trait |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/33204 |
| work_keys_str_mv | AT chujenyou highresolutionnearfieldopticalmicroscopyasub10nanometerprobeforsurfaceelectromagneticfieldandlocaldielectrictrait AT wangjuenkai highresolutionnearfieldopticalmicroscopyasub10nanometerprobeforsurfaceelectromagneticfieldandlocaldielectrictrait |