Chu, J., & Wang, J. (2012). High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait. IntechOpen. https://doi.org/10.5772/27458
Chicago Style (17th ed.) CitationChu, Jen-You, and Juen-Kai Wang. High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait. IntechOpen, 2012. https://doi.org/10.5772/27458.
MLA (9th ed.) CitationChu, Jen-You, and Juen-Kai Wang. High-Resolution Near-Field Optical Microscopy: A Sub-10 Nanometer Probe for Surface Electromagnetic Field and Local Dielectric Trait. IntechOpen, 2012. https://doi.org/10.5772/27458.
Warning: These citations may not always be 100% accurate.