Confocal White Light Reflection Imaging for Characterization of Nanostructures
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| Main Authors: | , , , , |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/33202 |
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| _version_ | 1839564585515876352 |
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| author | Du, C. L. You, Y. M. Ni, Z. H. Kasim, J. Shen, Z. X. |
| author_facet | Du, C. L. You, Y. M. Ni, Z. H. Kasim, J. Shen, Z. X. |
| author_sort | Du, C. L. |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/27636 |
| first_indexed | 2025-08-04T22:11:38Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-33202</identifier><datestamp>2012-03-21</datestamp>
<dc:title>Confocal White Light Reflection Imaging for Characterization of Nanostructures</dc:title>
<dc:creator>C. L. Du</dc:creator>
<dc:creator>Y. M. You</dc:creator>
<dc:creator>Z. H. Ni</dc:creator>
<dc:creator>J. Kasim</dc:creator>
<dc:creator>Z. X. Shen</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2012-03-21</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/33202</dc:identifier>
<dc:identifier>doi:10.5772/27636</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-51-0153-6</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/875 ; Advanced Photonic Sciences</dc:source>
</oai_dc:dc> |
| id | InTech-33202 |
| institution | Matheson Library |
| isbn | 978-953-51-0153-6 |
| language | English |
| last_indexed | 2025-08-04T22:11:38Z |
| publishDate | 2012 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-332022012-03-21 Confocal White Light Reflection Imaging for Characterization of Nanostructures C. L. Du Y. M. You Z. H. Ni J. Kasim Z. X. Shen Physical Sciences, Engineering and Technology None IntechOpen 2012-03-21 Chapter, Part Of Book https://www.intechopen.com/chapters/33202 doi:10.5772/27636 en ISBN:978-953-51-0153-6 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/875 ; Advanced Photonic Sciences |
| spellingShingle | Physical Sciences, Engineering and Technology Du, C. L. You, Y. M. Ni, Z. H. Kasim, J. Shen, Z. X. Confocal White Light Reflection Imaging for Characterization of Nanostructures |
| title | Confocal White Light Reflection Imaging for Characterization of Nanostructures |
| title_full | Confocal White Light Reflection Imaging for Characterization of Nanostructures |
| title_fullStr | Confocal White Light Reflection Imaging for Characterization of Nanostructures |
| title_full_unstemmed | Confocal White Light Reflection Imaging for Characterization of Nanostructures |
| title_short | Confocal White Light Reflection Imaging for Characterization of Nanostructures |
| title_sort | confocal white light reflection imaging for characterization of nanostructures |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/33202 |
| work_keys_str_mv | AT ducl confocalwhitelightreflectionimagingforcharacterizationofnanostructures AT youym confocalwhitelightreflectionimagingforcharacterizationofnanostructures AT nizh confocalwhitelightreflectionimagingforcharacterizationofnanostructures AT kasimj confocalwhitelightreflectionimagingforcharacterizationofnanostructures AT shenzx confocalwhitelightreflectionimagingforcharacterizationofnanostructures |