Confocal White Light Reflection Imaging for Characterization of Nanostructures

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Bibliographic Details
Main Authors:	Du, C. L., You, Y. M., Ni, Z. H., Kasim, J., Shen, Z. X.
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2012
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/33202
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