Spectral Clustering and Its Application in Machine Failure Prognosis

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Bibliographic Details
Main Authors: Li, Weihua, Chen, Yan, Liu, Wen, Lee, Jay
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2012
Subjects:
Online Access:https://www.intechopen.com/chapters/29867
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Summary:None
ISBN:978-953-51-0115-4
DOI:10.5772/35970