Li, W., Chen, Y., Liu, W., & Lee, J. (2012). Spectral Clustering and Its Application in Machine Failure Prognosis. IntechOpen. https://doi.org/10.5772/35970
Chicago Style (17th ed.) CitationLi, Weihua, Yan Chen, Wen Liu, and Jay Lee. Spectral Clustering and Its Application in Machine Failure Prognosis. IntechOpen, 2012. https://doi.org/10.5772/35970.
MLA (9th ed.) CitationLi, Weihua, et al. Spectral Clustering and Its Application in Machine Failure Prognosis. IntechOpen, 2012. https://doi.org/10.5772/35970.
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