The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science
None
Saved in:
| Main Authors: | Christien, Frédéric, Ferchaud, Edouard, Nowakowski, Pawel, Allart, Marion |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/27340 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Dependence of Determination Quality on Performance Capacity of Researching Technique, Exemplified by the Electron Probe X-Ray Microanalysis
by: Pavlova, Liudmila
Published: (2011) -
Electron beam x-ray microanalysis
by: Heinrich, Kurt F. J.
Published: (1981) -
Scanning electron microscopy and X-ray microanalysis a text for biologists, materials scientists, and geologists
Published: (1981) -
Microanalysis by the ring-oven technique /
by: Weisz, Herbert
Published: (1970) -
X-ray microanalysis in biology
Published: (1980)


