The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science
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| Main Authors: | , , , |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2012
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| Online Access: | https://www.intechopen.com/chapters/27340 |
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| _version_ | 1839564796815474688 |
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| author | Christien, Frédéric Ferchaud, Edouard Nowakowski, Pawel Allart, Marion |
| author_facet | Christien, Frédéric Ferchaud, Edouard Nowakowski, Pawel Allart, Marion |
| author_sort | Christien, Frédéric |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/28877 |
| first_indexed | 2025-08-04T22:15:00Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-27340</identifier><datestamp>2012-02-01</datestamp>
<dc:title>The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science</dc:title>
<dc:creator>Frédéric Christien</dc:creator>
<dc:creator>Edouard Ferchaud</dc:creator>
<dc:creator>Pawel Nowakowski</dc:creator>
<dc:creator>Marion Allart</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2012-02-01</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/27340</dc:identifier>
<dc:identifier>doi:10.5772/28877</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-307-967-7</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/915 ; X-Ray Spectroscopy</dc:source>
</oai_dc:dc> |
| id | InTech-27340 |
| institution | Matheson Library |
| isbn | 978-953-307-967-7 |
| language | English |
| last_indexed | 2025-08-04T22:15:00Z |
| publishDate | 2012 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-273402012-02-01 The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science Frédéric Christien Edouard Ferchaud Pawel Nowakowski Marion Allart Physical Sciences, Engineering and Technology None IntechOpen 2012-02-01 Chapter, Part Of Book https://www.intechopen.com/chapters/27340 doi:10.5772/28877 en ISBN:978-953-307-967-7 https://creativecommons.org/licenses/by/3.0/ https://www.intechopen.com/books/915 ; X-Ray Spectroscopy |
| spellingShingle | Physical Sciences, Engineering and Technology Christien, Frédéric Ferchaud, Edouard Nowakowski, Pawel Allart, Marion The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science |
| title | The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science |
| title_full | The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science |
| title_fullStr | The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science |
| title_full_unstemmed | The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science |
| title_short | The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science |
| title_sort | use of electron probe microanalysis to determine the thickness of thin films in materials science |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/27340 |
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