APA (7th ed.) Citation

Christien, F., Ferchaud, E., Nowakowski, P., & Allart, M. (2012). The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science. IntechOpen. https://doi.org/10.5772/28877

Chicago Style (17th ed.) Citation

Christien, Frédéric, Edouard Ferchaud, Pawel Nowakowski, and Marion Allart. The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science. IntechOpen, 2012. https://doi.org/10.5772/28877.

MLA (9th ed.) Citation

Christien, Frédéric, et al. The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science. IntechOpen, 2012. https://doi.org/10.5772/28877.