Material Characterization and Failure Analysis for Microelectronics Assembly Processes
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| Main Authors: | Huang, Chien-Yi, Li, Ming-Shu, Huang, Shan-Yu, Chang, Cheng-I, Huang, Min-Hui |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/23751 |
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