Effect of Native Oxide on the Electric Field-induced Characteristics of Device-quality Silicon at Room Temperature

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Effect of Native Oxide on the Electric Field-induced Characteristics of Device-quality Silicon at Room Temperature

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Bibliographic Details
Main Authors:	Khlyap, Halyna, Laptev, Viktor, Pankiv, Luydmila, Tsmots, Volodymyr
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/17723
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