Effect of Native Oxide on the Electric Field-induced Characteristics of Device-quality Silicon at Room Temperature

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Bibliografiske detaljer
Main Authors: Khlyap, Halyna, Laptev, Viktor, Pankiv, Luydmila, Tsmots, Volodymyr
Format: Electronisk Book Chapter
Sprog:engelsk
Udgivet: IntechOpen 2011
Fag:
Online adgang:https://www.intechopen.com/chapters/17723
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