Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

None

Saved in:
Bibliographic Details
Main Authors: Koren, Elad, Allen, Jonathan E., Givan, Uri, Berkovitch, Noel, Hemesath, Eric R., Lauhon, Lincoln J., Rosenwaks, Yossi
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2011
Subjects:
Physical Sciences, Engineering and Technology
Online Access:https://www.intechopen.com/chapters/16377
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items