Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
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| Main Authors: | , , , , , , |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
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| Online Access: | https://www.intechopen.com/chapters/16377 |
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| _version_ | 1839563244861128704 |
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| author | Koren, Elad Allen, Jonathan E. Givan, Uri Berkovitch, Noel Hemesath, Eric R. Lauhon, Lincoln J. Rosenwaks, Yossi |
| author_facet | Koren, Elad Allen, Jonathan E. Givan, Uri Berkovitch, Noel Hemesath, Eric R. Lauhon, Lincoln J. Rosenwaks, Yossi |
| author_sort | Koren, Elad |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/19333 |
| first_indexed | 2025-08-04T21:50:19Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-16377</identifier><datestamp>2011-07-18</datestamp>
<dc:title>Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy</dc:title>
<dc:creator>Elad Koren</dc:creator>
<dc:creator>Jonathan E. Allen</dc:creator>
<dc:creator>Uri Givan</dc:creator>
<dc:creator>Noel Berkovitch</dc:creator>
<dc:creator>Eric R. Hemesath</dc:creator>
<dc:creator>Lincoln J. Lauhon</dc:creator>
<dc:creator>Yossi Rosenwaks</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2011-07-18</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/16377</dc:identifier>
<dc:identifier>doi:10.5772/19333</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-307-318-7</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by-nc-sa/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/514 ; Nanowires - Implementations and Applications</dc:source>
</oai_dc:dc> |
| id | InTech-16377 |
| institution | Matheson Library |
| isbn | 978-953-307-318-7 |
| language | English |
| last_indexed | 2025-08-04T21:50:19Z |
| publishDate | 2011 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-163772011-07-18 Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy Elad Koren Jonathan E. Allen Uri Givan Noel Berkovitch Eric R. Hemesath Lincoln J. Lauhon Yossi Rosenwaks Physical Sciences, Engineering and Technology None IntechOpen 2011-07-18 Chapter, Part Of Book https://www.intechopen.com/chapters/16377 doi:10.5772/19333 en ISBN:978-953-307-318-7 https://creativecommons.org/licenses/by-nc-sa/3.0/ https://www.intechopen.com/books/514 ; Nanowires - Implementations and Applications |
| spellingShingle | Physical Sciences, Engineering and Technology Koren, Elad Allen, Jonathan E. Givan, Uri Berkovitch, Noel Hemesath, Eric R. Lauhon, Lincoln J. Rosenwaks, Yossi Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy |
| title | Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy |
| title_full | Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy |
| title_fullStr | Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy |
| title_full_unstemmed | Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy |
| title_short | Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy |
| title_sort | nano scale measurements of dopants and electronic impurities in individual silicon nanowires using kelvin probe force microscopy |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/16377 |
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