APA (7th ed.) Citation

Koren, E., Allen, J. E., Givan, U., Berkovitch, N., Hemesath, E. R., Lauhon, L. J., & Rosenwaks, Y. (2011). Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy. IntechOpen. https://doi.org/10.5772/19333

Chicago Style (17th ed.) Citation

Koren, Elad, Jonathan E. Allen, Uri Givan, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon, and Yossi Rosenwaks. Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy. IntechOpen, 2011. https://doi.org/10.5772/19333.

MLA (9th ed.) Citation

Koren, Elad, et al. Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy. IntechOpen, 2011. https://doi.org/10.5772/19333.