Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering
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| Main Authors: | Albella, Pablo, González, Francisco, Moreno, Fernando, Saiz, José María, Videen, Gorden |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/14161 |
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