Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering
None
Saved in:
| Main Authors: | , , , , |
|---|---|
| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
|
| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/14161 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|