Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering
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| Main Authors: | , , , , |
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| Format: | Electronic Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2011
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/14161 |
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| _version_ | 1839561365148139520 |
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| author | Albella, Pablo González, Francisco Moreno, Fernando Saiz, José María Videen, Gorden |
| author_facet | Albella, Pablo González, Francisco Moreno, Fernando Saiz, José María Videen, Gorden |
| author_sort | Albella, Pablo |
| collection | InTech Open eBooks |
| description | None |
| doi_str_mv | 10.5772/14049 |
| first_indexed | 2025-08-04T21:20:27Z |
| format | Electronic Book Chapter |
| fullrecord | <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-14161</identifier><datestamp>2011-03-16</datestamp>
<dc:title>Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering</dc:title>
<dc:creator>Pablo Albella</dc:creator>
<dc:creator>Francisco González</dc:creator>
<dc:creator>Fernando Moreno</dc:creator>
<dc:creator>José María Saiz</dc:creator>
<dc:creator>Gorden Videen</dc:creator>
<dc:subject>Physical Sciences, Engineering and Technology</dc:subject>
<dc:description>None</dc:description>
<dc:publisher>IntechOpen</dc:publisher>
<dc:date>2011-03-16</dc:date>
<dc:type>Chapter, Part Of Book</dc:type>
<dc:identifier>https://www.intechopen.com/chapters/14161</dc:identifier>
<dc:identifier>doi:10.5772/14049</dc:identifier>
<dc:language>en</dc:language>
<dc:relation>ISBN:978-953-307-275-3</dc:relation>
<dc:rights>https://creativecommons.org/licenses/by-nc-sa/3.0/</dc:rights>
<dc:source>https://www.intechopen.com/books/52 ; Wave Propagation</dc:source>
</oai_dc:dc> |
| id | InTech-14161 |
| institution | Matheson Library |
| isbn | 978-953-307-275-3 |
| language | English |
| last_indexed | 2025-08-04T21:20:27Z |
| publishDate | 2011 |
| publisher | IntechOpen |
| record_format | intech |
| spelling | InTech-141612011-03-16 Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering Pablo Albella Francisco González Fernando Moreno José María Saiz Gorden Videen Physical Sciences, Engineering and Technology None IntechOpen 2011-03-16 Chapter, Part Of Book https://www.intechopen.com/chapters/14161 doi:10.5772/14049 en ISBN:978-953-307-275-3 https://creativecommons.org/licenses/by-nc-sa/3.0/ https://www.intechopen.com/books/52 ; Wave Propagation |
| spellingShingle | Physical Sciences, Engineering and Technology Albella, Pablo González, Francisco Moreno, Fernando Saiz, José María Videen, Gorden Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering |
| title | Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering |
| title_full | Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering |
| title_fullStr | Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering |
| title_full_unstemmed | Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering |
| title_short | Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering |
| title_sort | detection and characterization of nano defects located on micro structured substrates by means of light scattering |
| topic | Physical Sciences, Engineering and Technology |
| url | https://www.intechopen.com/chapters/14161 |
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