APA (7th ed.) Citation

Albella, P., González, F., Moreno, F., Saiz, J. M., & Videen, G. (2011). Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering. IntechOpen. https://doi.org/10.5772/14049

Chicago Style (17th ed.) Citation

Albella, Pablo, Francisco González, Fernando Moreno, José María Saiz, and Gorden Videen. Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering. IntechOpen, 2011. https://doi.org/10.5772/14049.

MLA (9th ed.) Citation

Albella, Pablo, et al. Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering. IntechOpen, 2011. https://doi.org/10.5772/14049.