A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs

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Main Authors: Jaud, Marie-Anne, Barraud, Sylvain, Dollfus, Philippe, Saint-Martin, Jérôme, Bournel, Arnaud, Jaouen, Hervé
Format: Electronic Book Chapter
Language:English
Published: IntechOpen 2011
Subjects:
Online Access:https://www.intechopen.com/chapters/14017
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author Jaud, Marie-Anne
Barraud, Sylvain
Dollfus, Philippe
Saint-Martin, Jérôme
Bournel, Arnaud
Jaouen, Hervé
author_facet Jaud, Marie-Anne
Barraud, Sylvain
Dollfus, Philippe
Saint-Martin, Jérôme
Bournel, Arnaud
Jaouen, Hervé
author_sort Jaud, Marie-Anne
collection InTech Open eBooks
description None
doi_str_mv 10.5772/15942
first_indexed 2025-08-04T22:37:10Z
format Electronic
Book Chapter
fullrecord <oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"><identifier>InTech-14017</identifier><datestamp>2011-02-28</datestamp> <dc:title>A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs</dc:title> <dc:creator>Marie-Anne Jaud</dc:creator> <dc:creator>Sylvain Barraud</dc:creator> <dc:creator>Philippe Dollfus</dc:creator> <dc:creator>Jérôme Saint-Martin</dc:creator> <dc:creator>Arnaud Bournel</dc:creator> <dc:creator>Hervé Jaouen</dc:creator> <dc:subject>Physical Sciences, Engineering and Technology</dc:subject> <dc:description>None</dc:description> <dc:publisher>IntechOpen</dc:publisher> <dc:date>2011-02-28</dc:date> <dc:type>Chapter, Part Of Book</dc:type> <dc:identifier>https://www.intechopen.com/chapters/14017</dc:identifier> <dc:identifier>doi:10.5772/15942</dc:identifier> <dc:language>en</dc:language> <dc:relation>ISBN:978-953-307-691-1</dc:relation> <dc:rights>https://creativecommons.org/licenses/by-nc-sa/3.0/</dc:rights> <dc:source>https://www.intechopen.com/books/1485 ; Applications of Monte Carlo Method in Science and Engineering</dc:source> </oai_dc:dc>
id InTech-14017
institution Matheson Library
isbn 978-953-307-691-1
language English
last_indexed 2025-08-04T22:37:10Z
publishDate 2011
publisher IntechOpen
record_format intech
spelling InTech-140172011-02-28 A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs Marie-Anne Jaud Sylvain Barraud Philippe Dollfus Jérôme Saint-Martin Arnaud Bournel Hervé Jaouen Physical Sciences, Engineering and Technology None IntechOpen 2011-02-28 Chapter, Part Of Book https://www.intechopen.com/chapters/14017 doi:10.5772/15942 en ISBN:978-953-307-691-1 https://creativecommons.org/licenses/by-nc-sa/3.0/ https://www.intechopen.com/books/1485 ; Applications of Monte Carlo Method in Science and Engineering
spellingShingle Physical Sciences, Engineering and Technology
Jaud, Marie-Anne
Barraud, Sylvain
Dollfus, Philippe
Saint-Martin, Jérôme
Bournel, Arnaud
Jaouen, Hervé
A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs
title A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs
title_full A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs
title_fullStr A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs
title_full_unstemmed A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs
title_short A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs
title_sort pearson effective potential for monte carlo simulation of quantum confinement effects in nmosfets
topic Physical Sciences, Engineering and Technology
url https://www.intechopen.com/chapters/14017
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