A Pearson Effective Potential for Monte-Carlo Simulation of Quantum Confinement Effects in nMOSFETs

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Bibliographic Details
Main Authors:	Jaud, Marie-Anne, Barraud, Sylvain, Dollfus, Philippe, Saint-Martin, Jérôme, Bournel, Arnaud, Jaouen, Hervé
Format:	Electronic Book Chapter
Language:	English
Published:	IntechOpen 2011
Subjects:	Physical Sciences, Engineering and Technology
Online Access:	https://www.intechopen.com/chapters/14017
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