Aubry-Fortuna, V., Huet, K., Nghiêm, T. T., Bournel, A., Saint-Martin, J., & Dollfus, P. (2011). Strain Effects in p-type Devices using Full-Band Monte Carlo Simulations. IntechOpen. https://doi.org/10.5772/15524
Chicago Style (17th ed.) CitationAubry-Fortuna, Valérie, Karim Huet, T.T. Trang Nghiêm, Arnaud Bournel, Jérôme Saint-Martin, and Philippe Dollfus. Strain Effects in P-type Devices Using Full-Band Monte Carlo Simulations. IntechOpen, 2011. https://doi.org/10.5772/15524.
MLA (9th ed.) CitationAubry-Fortuna, Valérie, et al. Strain Effects in P-type Devices Using Full-Band Monte Carlo Simulations. IntechOpen, 2011. https://doi.org/10.5772/15524.
Warning: These citations may not always be 100% accurate.